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  1. Home
  2. Chemistry of electronic materials
  3. Materials characterization

Materials characterization

OpenStax
@
Rutherford backscattering of thin films
1   Introduction
2   Basic concept of rutherford backscattering spectroscopy
3   Experimental set-up
4   Depth profile analysis
5   Quantitative analysis
6   Limitations
7   Summary
8   Bibliography
The application of vsi (vertical scanning interferometry) to the study
Atomic force microscopy

Source:  OpenStax, Chemistry of electronic materials. OpenStax CNX. Aug 09, 2011 Download for free at http://cnx.org/content/col10719/1.9
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