Experiment design
The main information can be obtained using XAFS spectra consist in small changes in the absorption coefficient ( E ), which can be measured directly in a transmission mode or indirectly using a fluorescence mode. Therefore, a good signal to noise ratio is required (better than 10 3 ). In order to obtain this signal to noise ratio, an intense beam is required (on the order 10 10 photons/second or better), with the energy bandwidth of 1 eV or less, and the capability of scanning the energy of the incident beam over a range of about 1 KeV above the edge in a time range of seconds or few minutes. As a result, synchrotron radiation is preferred further than other kind of X-ray sources previously mentioned.
Beamline setup
Despite the setup of a synchrotron beamline is mostly done by the assistance of specialist beamline scientists, nevertheless, it is useful to understand the system behind the measurement. The main components of a XAFS beamline, shown in [link] , are as follows:
- A harmonic rejection mirror to reduce the harmonic content of the X-ray beam.
- A monochromator to choose the X-ray energy.
- A series of slits which defines the X-ray profile.
- A sample positioning stage.
- The detectors, which can be a single ionization detector or a group of detectors to measure the X-ray intensity.
Slits are used to define the X-ray beam profile and to block unwanted X-rays. Slits can be used to increase the energy resolution of the X-ray incident on the sample at the expense of some loss in X-ray intensity. They are either fixed or adjustable slits. Fixed slits have a pre-cut opening of heights between 0.2 and 1.0 mm and a width of some centimeters. Adjustable slits use metal plates that move independently to define each edge of the X-ray beam.
Monochromator
The monochromator is used to select the X-ray energy incident on the sample. There are two main kinds of X-ray monochromators:
- The double-crystal monochromator, which consists of two parallel crystals.
- The channel-cut monochromator, which is a single crystal with a slot cut nearly through it.
Most monochromator crystals are made of silicon or germanium and are cut and polished such that a particular atomic plane of the crystal is parallel to the surface of the crystal as Si(111), Si(311), or Ge(111). The energy of X-rays diffracted by the crystal is controlled by rotating the crystals in the white beam.
Harmonic rejection mirrors
The harmonic X-ray intensity needs to be reduced, as these X-rays will adversely affect the XAS measurement. A common method for removing harmonic X-rays is using a harmonic rejection mirror. This mirror is usually made of Si for low energies, Rh for X-ray energies below the Rh absorption edge at 23 keV, or Pt for higher X-ray energies. The mirror is placed at a grazing angle in the beam such that the X-rays with fundamental energy are reflected toward the sample, while the harmonic X-rays are not.
Detectors
Most X-ray absorption measurements use ionization detectors. These contain two parallel plates separated by a gas-filled space that the X-rays travel through. Some of the X-rays ionize the gas particles. A voltage bias applied to the parallel plates separates the gas ions, creating a current. The applied voltage should give a linear detector response for a given change in the incident X-ray intensity. There are also other kinds as fluorescence and electron yield detectors.